The 2-day seminar begins with an examination of ISO and FDA regulations and guidelines regarding the use of statistics. Basic vocabulary and concepts are then reviewed and discussed. The flow of subsequent topics over the 2 days is as follows:
Why should you attend?
Almost all design and/or manufacturing companies evaluate product and processes either to establish product/process specifications, to QC to such specifications, and/or to monitor compliance to such specifications.
The various statistical methods used to support such activities can be intimidating to master. If used incorrectly, such methods can result in new products being launched that should have been kept in R&D; or, conversely, deciding to not launch a new product because of incorrectly calculated product reliability or process capability. In QC, mistakenly chosen sample sizes and inappropriate statistical methods may result product being rejected that should have passed, and vice-versa.
This seminar provides a practical approach to understanding how to interpret and use a standard tool-box of statistical methods, including confidence intervals, t-tests, Normal K-tables, Normality tests, confidence/reliability calculations, AQL sampling plans, measurement equipment analysis, and Statistical Process Control. Without a clear understanding and correct implementation of such methods, a company risks significantly increasing its complaint rates, scrap rates, and time-to-market; and significantly reducing its product and service quality, its customer satisfaction levels, and its profit margins.
Who Will Benefit:
Areas Covered in the Session:
Agenda:
Day One:
Lecture 1: Regulatory Requirements
Lecture 2: Vocabulary and Concepts
Lecture 3: Confidence Intervals (attribute and variables data)
Lecture 4: t-Tests and related "power" estimations
Lecture 5: Confidence/Reliability calculations for Proportions
Lecture 6: Confidence/Reliability calculations for normally distributed data (K-tables)
Lecture 7: Normality Tests and Normality Transformations
Day Two
Lecture 8: Reliability Plotting (e.g., for non-normal data and/or censored studies)
Lecture 9: Statistical Analysis of Gages (introduction to Gage R&R;, Gage Correlation, etc.)
Lecture 10: QC Sampling Plans (attribute AQL plans and alternatives to such plans)
Lecture 11: Statistical Process Control (introduction, with focus on XbarR charts)
Lecture 12: Process Capability Indices calculations (Cp, Cpk, Pp, Ppk)
Lecture 13: Implementation Recommendations
About Speaker:
John N. Zorich is a Statistical Consultant & Trainer, Ohlone College & SV Polytechnic.
John N. Zorich, has spent 35 years in the medical device manufacturing industry; the first 20 years were as a "regular" employee in the areas of R&D;, Manufacturing, QA/QC, and Regulatory; the last 15 years were as consultant in the areas of QA/QC and Statistics. His consulting clients in the area of statistics have included numerous start-ups as well as large corporations such as Boston Scientific, Novellus, and Siemens Medical. His experience as an instructor in statistics includes having given 3-day workshop/seminars for the past several years at Ohlone College (San Jose CA), 1-day training workshops in SPC for Silicon Valley Polytechnic Institute (San Jose CA) for several years, several 3-day courses for ASQ Biomedical, numerous seminars at ASQ meetings and conferences, and half-day seminars for numerous private clients. He creates and sells formally-validated statistical application spreadsheets that have been purchased by more than 75 companies, world-wide.
DATE, VENUE & PRICE:
Location: SFO, CA| Date: July 9th & 10th, 2015| Time: 9 AM to 6 PM CST
Venue: DoubleTree by Hilton Hotel San Francisco Airport
Venue Address: 835 Airport Blvd., Burlingame CA 94010-9949
Price: $1,295.00
Register now and save $200. (Early Bird)
Until June 06, Early Bird Price: $1,295.00
From June 07 to July 07, Regular Price: $1,495.00
Registration Link - http://bit.ly/1FZ6yke
Contact Information:
NetZealous LLC,
DBA GlobalCompliancePanel,
161 Mission Falls Lane,
Suite 216, Fremont, CA 94539, USA
Phone: 1800 447 9407
Fax: 302 288 6884
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